The Central Research Facility (CRF) was established in the year 2015 and provides a scientific platform for research due to the provision of state-of-the -art equipment supported by cutting edge technologies at a single location.
Prof. Debadutta Mishra
Professor, Production Engineering,
The CRF consists of HITACHI make SU3500 Scanning Electron Microscope (SEM) used for surface characterization of all kind of solid samples. The equipment consists of both secondary electron (SE) and back scattered electron (BSE) detectors and enables observing surface morphology in micron/nano level.
The SEM is integrated with an Energy Dispersive Spectroscopy (EDS) system of Oxford INCA x-act model and is used for elemental analysis, line scanning and mapping of the present elements in the sample.
SEM with EDS
The CRF is also equipped with a X-ray Diffraction (XRD) Machine of Bruker Make (Model- D8-ADVANCE) for structural analysis of materials. There is provision to extracting structural information from X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS) analysis, "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).
X-ray Diffraction Machine